ECE5480
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ECE5480 - VLSI Testing and Security - 3 - Credits
Dual-Listed Courses
-
Course Title
VLSI Testing and Security
Grade Mode
Standard Letter
Repeat Status
NR
Course Description
Students learn the theory and practice of testing VLSI systems. The topics cover fault modeling, fault simulation, test generation, secure hardware testing, scan design, and design for testability (DFT). Students get experience with commercial testing and DFT tools. Additional coursework is required for those enrolled in the graduate-level course.
Credit Hours Min
3
Registration Restrictions
Admission to the professional program
